Extrusion International 2-2026

24 Extrusion International 2/2026 FILM EXTRUSION, QUALITY CONTROL Inline Defect Detection for Optimal Quality Control in Film Extrusion Increasing demands for quality control, surface nish, and defect tolerance in plastic lms and web materials present manufacturers with ever-growing challenges. In this context, inline defect detection systems offer unprecedented capabilities for precise defect identi cation, enabling seamless quality control like never before. The high adaptability and customization of these systems play a decisive role in delivering tailored solutions for a wide range of applications. SBI Mechatronik GmbH (SBI), known for its compre- hensive portfolio of inline thickness measurement de- vices, has expanded its product range with state-of-the- art image processing systems (WIS 1000), characterized by their exibility and ability to adapt to individual cus - tomer requirements. A skilled team at SBI coordinates product develop- ment, manufacturing, and customer service. Additional research and development capacities at the sister com- pany Lohia Mechatronik in India further drive software development, particularly for applications involving ar- ti cial intelligence (machine learning). The Technology The WIS 1000 system detects and classi es low-con - trast defects in plastic lms and sheets, nonwovens, and many other substrates. It provides a high-speed solution for the overall quality assessment of most web-based materials. Highly customizable and exible, the system is avail - able for a wide range of requirements and con gura - tions, from technical materials to sensitive pharmaceutical applica- tions. It detects all kinds of defects, such as gels, holes, bubbles, con- tamination, spots, coating inconsis- tencies, streaks, etc. The system handles web widths from 10 mm to 10 meters. The high-resolution camera system (advanced line scan cameras) cap- tures precise images of the moving material and can detect defects as small as 10 µm at web speeds of up to 1.000 meters per minute. To maximize the contrast of potential material defects, cameras and light sources are positioned in various setup configurations. The equally customizable lighting system allows for optimal illumina- tion in each installation, offering high intensity and uni- formity with low power consumption (high ef ciency: 220 lumens/watt). Any type of defect can be categorized and differen- tiated, as well as automatically classi ed by type and size. New defect categories can be easily de ned in the work ow and learned by the system, even with AI as - sistance. The powerful system is operated via a resistive touch panel or panel PC. For real-time monitoring, various pa- rameters can be tracked, such as runtime graphs, histo- grams, and defect density alarms. The user-friendly, modular, and freely con gurable visual interface and control center (HMI) has been de- signed with a focus on usability, functionality, and pro- ductivity. The system enables real-time defect monitor- ing, classi cation, and trend analysis of defect density through structured reporting. An intuitive system that makes defects visible. Picture 1: WIS 1000-System with labelling-station