Extrusion Asia Edition 1-2019

T his additional measurement system makes it possible to de- tect the EVOH layer of transparent and opaque multi-layer plastics. To determine the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using our mo- dern analytical methods. SBI mainly focuses with this measuring system on measuring PP/EVOH/PP sheets, but it is also possible to gauge other EVOH- polymer compounds with the help of extended analysis-algo- rithms. The new gauge measures the total thickness of multi-layer sheets in microns (see diagram 1), the die bolts over the mea- suring width (see diagram 2), and in addition to it the EVOH layer distribution which is shown in diagram 3. The infrared measuring system is a relative measurement and yields the ab- solute EVOH layer thickness by the means of calibration. SBI是一家在线测厚装置领域 受欢迎的生产商，生产用于挤出薄 膜和片材的厚度测量装置。新开发 的测量仪表(KAPA-IR)是用于确定 EVOH (乙烯-乙烯醇共聚物)膜层厚 度的传感器系统，一种是电容式测 量方法，另一种与此不同的是特种 红外线(IR)测量方法。 SBI is a popular producer of inline thickness measuring devices for film and sheet extru- sion. The new developed gauge (KAPA-IR) contains the capaci- tive measurement process and in addition to it also a special infrared (IR) which is a sensor system that determines the EVOH (Ethylene vinyl alcohol) layer thickness. 这种附加的测量系统能够实现探测透明的和不透明的多 层塑料薄膜中的EVOH层。为了确定EVOH层的厚度，塑料的 广谱红外线被记录下来，对EVOH聚合物分子产生的吸收被 记录下来并采用现代化的分析方法进行评估。 SBI主要致力于这种测量系统，测量PP/EVOH/PP片 材，但在扩展的分析算法帮助下，同样能够计量其它EVOH- 聚合物的化合物。 最新的计量仪表以微米单位测量多层片材总的厚度（见 图1）。整个测量宽度上的模头螺栓（见图2）以及此外的 EVOH层的分布示于图3。红外线测量系统是比例相对测量方 式，通过标定得到EVOH层的厚度。 目前，为了得到恒定一致的质量，确定EVOH层分布是 非常重要的。在大多数情况下，EVOH层的厚度是通过显微 镜在实验室中测定的。 SBI提供了在线无接触的方便易用的厚度测量装置，在 生产过程中可以控制EVOH阻隔层的厚度。 32 测量技术 Extrusion Asia Edition 1/2019 KARA-IR厚度测量装置，用于探测EVOH阻隔层 KAPA-IR thickness measuring device for detecting the EVOH barrier layer 新型阻隔层（EVOH）在线厚度测量装置 介绍 Measurement Technology: New Barrier Layer (EVOH) Inline Thickness Measuring Device introduced